Test and measurement manufacturer OmniTek will demonstrate a new, high-performance eye pattern and jitter analysis module for its TQ, XR and LAB waveform monitors at NAB2007.
The new eye and jitter module supports all SD and HD serial digital video formats and provides a wide range of analysis capabilities including high-resolution color-mapped eye diagrams, FFT jitter spectrum analysis, cable length and jitter waveform displays.
The company also will roll out a comprehensive upgrade to all the audio analysis options for the TQ and XR high-resolution waveform monitors. The metering displays have been dramatically enhanced to include support for a wide range of different ballistics and graticules.
For more information, visit www.omnitek.tv.